CasaXPS processing software offers powerful analysis techniques for both spectral and imaging data. The system originally designed for XPS and Auger data now offers features covering a wide range of analytical techniques including ToF SIMS, dynamic SIMS and many more.
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A site license allows CasaXPS to be used throughout a university.
Numerous site licenses are owned by universities around the world (click here for list).
To determine if your institute is already covered by a site license or to make enquiries about purchasing licenses for CasaXPS, please contact neal@casaxps.com.
Videos and resources used in the making of videos are added to the XPS Video Channel.
The methodology presented within this work is a result of years of interactions between many junior and senior X-ray Photoelectron Spectroscopy (XPS) users operating within the CasaXPS spectral processing and interpretation program framework.
Cellulose is an example of a material that responds to XPS by the creation of new chemistry not present in the as-received sample. In this work, these problems are illustrated through an analysis of cellulose spectra obtained during a degradation study.
Peak fitting of x-ray photoelectron spectroscopy (XPS) data is the primary method for identifying and quantifying the chemical states of the atoms near the surface of a sample. Peak fitting is typically based on the minimization of a figure-of-merit.
Accurate elemental oxidation state determination for the outer surface of a complex material is of crucial importance in many science and engineering disciplines. Unlike traditional XPS spectra fitting, we present a method based on vector analysis.
Stay current with the latest developments in surface science. Our software is utilized in groundbreaking research across materials science, catalysis, and semiconductor physics.
We provide the full CasaXPS Manual and the Computer Aided Surface Analysis eBook.
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Analysis of evolving spectra by Principal Component Analysis (PCA) and Linear Least Squares (LLS) provide tools to examine complex oxide spectra. This offers a robust alternative to constrained parametrically defined peak models.
Perfect for analyzing depth profiles, angle-resolved data, or complex degradation studies.
Quantification by XPS involves measuring the intensity of photoelectron peaks and then applying adjustments to these intensities that account for sample, instrumental and physics impacts on the recorded intensities.
Free eBooks and detailed PDF guides designed to help you master CasaXPS.
Software features used for XPS Data Analysis.
ISBN: 978-1907465000
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Access the complete documentation online. This comprehensive resource includes in-depth technical guides, step-by-step processing procedures, and detailed reference material for all software features.
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