Publications Library

A comprehensive collection of 56 peer-reviewed articles, technical notes, and case studies utilizing CasaXPS for surface analysis.

Showing 1-56 of 56 Articles

1 Principal Component Analysis (PCA) unravels spectral components present in XPS spectra of complex oxide films on iron foil

Fairley, N., Bargiela, P., Huang, W.M. and Baltrusaitis, J., 2023.
Applied Surface Science Advances, 17, p.100447.

Abstract

Principal component analysis (PCA), as applied to the processing of the complex X-ray photoelectron spectroscopy (XPS) lineshapes, is discussed. PCA analysis example is provided of complex native iron oxide films on Fe foil XPS spectra further modified by argon and helium ion beams. Abstract PCA components are derived from Fe 2p, O 1 s and C 1 s regions leading to the assignments of surface (oxy)hydroxide, Fe2O3, FeO and Fe metal, as corroborated by the corresponding elemental quantification profiles. Detailed mathematical concepts behind PCA analysis of spectra data are provided.

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2 Systematic and collaborative approach to problem solving using X-ray photoelectron spectroscopy.

Fairley, N., Fernandez, V., Richard-Plouet, M., Guillot-Deudon, C., Walton, J., Smith, E., Flahaut, D., Greiner, M., Biesinger, M., Tougaard, S. and Morgan, D., 2021.
Applied Surface Science Advances, 5, p.100112.

Abstract

The methodology presented within this work is a result of years of interactions between many junior and senior X-ray Photoelectron Spectroscopy (XPS) users operating within the CasaXPS spectral processing and interpretation program framework. In particular, discussions arising from a series of workshops have been a significant source for developing the overall XPS data processing concept and are the motivation for creating this work. These workshops organized by the Institut des Matériaux Jean Rouxel (IMN), Nantes gather both experienced and novice users of XPS for a week of discourse in conceptual experiment design and the resulting data processing. However, the framework constructed and utilized within these workshops encouraged the dissemination of knowledge beyond XPS data analysis and emphasized the importance of a multi-disciplinary collaborative approach to surface analysis problem-solving. The material presented here embodies data treatment originating from data made available to the first CNRS Thematic Workshop presented at Roscoff 2013. The methodology described here has evolved over the subsequent workshops in 2016 and 2019 and currently represents the philosophy used in CasaXPS spectral data processing paradigm.

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3 Guide to XPS data analysis: Applying appropriate constraints to synthetic peaks in XPS peak fitting

Major, G.H., Fernandez, V., Fairley, N., Smith, E.F. and Linford, M.R., 2022.
Journal of Vacuum Science & Technology A, 40(6).

Abstract

Peak fitting of x-ray photoelectron spectroscopy (XPS) data is the primary method for identifying and quantifying the chemical states of the atoms near the surface of a sample. Peak fitting is typically based on the minimization of a figure-of-merit, such as the residual standard deviation (RSD). Here, we show that optimal XPS peak fitting is obtained when the peak shape (the synthetic mathematical function that represents the chemical states of the material) best matches the physics and chemistry of the underlying data. However, because this ideal peak shape is often unknown, constraints on the components of a fit are usually necessary to obtain good fits to data. These constraints may include fixing the relative full width at half maxima (peak widths), area ratios, and/or the relative positions of fit components. As shown in multiple examples, while unconstrained, less-than-optimal peak shapes may produce lower RSDs, they often lead to incorrect results. Thus, the “suboptimal” results (somewhat higher RSDs) that are obtained when constraints are applied to less-than-perfect peak shapes are often preferable because they prevent a fit from yielding unphysical or unchemical results. XPS peak fitting is best performed when all the information available about a sample is used, including its expected chemical and physical composition, information from other XPS narrow and survey scans from the same material, and information from other analytical techniques.

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4 Combining PCA and nonlinear fitting of peak models to re-evaluate C 1s XPS spectrum of cellulose.

Fernandez, V., Morgan, D., Bargiela, P., Fairley, N. and Baltrusaitis, J., 2023.
Applied Surface Science, 614, p.156182.

Abstract

Cellulose is an example of a material that responds to XPS by the creation of new chemistry not present in the as-received sample. While improvements in instrumentation may be seen in general as beneficial to surface science, recent studies have shown that the consequences for some materials are detrimental. In this work, these problems are illustrated through an analysis of cellulose spectra obtained during a degradation study. C 1s spectra are decomposed into two well-formed component curves that are open to chemical interpretation. In particular, a component-curve representative of pure cellulose is obtained as well as a second component curve that implies cellulose is degraded through the creation of carbon chemistry involving C-O, C=O and O-C=O. Since cellulose is a crystalline material, formed through the alignment of molecules under the influence of hydrogen bonds, the analysis and findings presented in this paper are relevant to any material analyzed by XPS whose properties are dependent on hydrogen bonds. The analysis techniques are based on an informed vectorial approach, which extracts directly from data spectral shapes that are used to monitor sample degradation via linear least squares optimization. Related mathematics of Principal Component Analysis and linear analysis are presented.

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5 Definition of a new (Doniach-Sunjic-Shirley) peak shape for fitting asymmetric signals applied to reduced graphene oxide/graphene oxide XPS spectra.

Moeini, B., Linford, M.R., Fairley, N., Barlow, A., Cumpson, P., Morgan, D., Fernandez, V. and Baltrusaitis, J., 2022.
Surface and Interface Analysis, 54(1), pp.67-77.

Abstract

The existence of asymmetry in X-ray photoelectron spectroscopy (XPS) photoemission lines is widely accepted, but line shapes designed to accommodate asymmetry are generally lacking in theoretical justification. In this work, we present a new line shape for describing asymmetry in XPS signals that is based on two facts. First, the most widely known line shape for fitting asymmetric XPS signals that has a theoretical basis, referred to as the Doniach-Sunjic (DS) line shape, suffers from a mathematical inconvenience, which is that for asymmetric shapes the area beneath the curve (above the x-axis) is infinite. Second, it is common practice in XPS to remove the inelastically scattered background response of a peak in question with the Shirley algorithm. The new line shape described herein attempts to retain the theoretical virtues of the DS line shape, while allowing the use of a Shirley background, with the consequence that the resulting line shape has a finite area. To illustrate the use of this Doniach-Sunjic-Shirley (DSS) line shape, a set of spectra obtained from varying amounts of graphene oxide (GO) and reduced GO on a patterned, heterogeneous surface are fit and discussed.

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6 Generalized molybdenum oxide surface chemical state XPS determination via informed amorphous sample model.

Baltrusaitis, J., Mendoza-Sanchez, B., Fernandez, V., Veenstra, R., Dukstiene, N., Roberts, A. and Fairley, N., 2015.
Applied Surface Science, 326, pp.151-161.

Abstract

Accurate elemental oxidation state determination for the outer surface of a complex material is of crucial importance in many science and engineering disciplines, including chemistry, fundamental and applied surface science, catalysis, semiconductors and many others. X-ray photoelectron spectroscopy (XPS) is the primary tool used for this purpose. The spectral data obtained, however, is often very complex and can be subject to incorrect interpretation. Unlike traditional XPS spectra fitting procedures using purely synthetic spectral components, here we develop and present an XPS data processing method based on vector analysis that allows creating XPS spectral components by incorporating key information, obtained experimentally. XPS spectral data, obtained from series of molybdenum oxide samples with varying oxidation states and degree of crystallinity, were processed using this method and the corresponding oxidation states present, as well as their relative distribution was elucidated. It was shown that monitoring the evolution of the chemistry and crystal structure of a molybdenum oxide sample due to an invasive X-ray probe could be used to infer solutions to complex spectral envelopes.

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7 A study of in situ reduction of MoO3 to MoO2 by X-ray Photoelectron Spectroscopy.

Garland, B.M., Fairley, N., Strandwitz, N.C., Thorpe, R., Bargiela, P. and Baltrusaitis, J., 2022.
Applied Surface Science, 598, p.153827

Abstract

Results from X-ray Photoelectron Spectroscopy (XPS) of molybdenum oxide samples are presented to elucidate how Mo (VI) oxide evolves to Mo (IV) oxide upon heating of a MoO3 sample. XPS data analysis techniques based on manipulation of spectra treated as vectors are shown and allow insights into intermediate phases of Mo oxide which suggest how the original oxide changes under the influence of heat but also supports an interpretation of as-received tetravalent Mo powders as multivalent materials. In particular, several new spectral components were observed and assigned to the Magnéli phase as well as MoO3 domains that have been modified by the presence of X-rays or temperature. These assignments comprise a new method of data processing where sample modification is used to inform XPS data interpretation and differ from previous work where the linear relationship of the binding energy of molybdenum oxides has been used.

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8 Quantification of oxide film thickness at the surface of aluminium using XPS

Alexander, M.R., Thompson, G.E., Zhou, X., Beamson, G. and Fairley, N., 2002.
Surface and Interface Analysis: An International Journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films, 34(1), pp.485-489.

Abstract

Oxide films grown anodically at the surface of superpure aluminium are used as standards to assess the accuracy of the thickness (dxps) determined using the Beer-Lambert treatment of the Al 2p metal and oxide peak intensities. For the fitting conditions employed, the value of dxps is found to be very close to the true film thickness for films < 10 nm thick, beyond which imprecise values are obtained. A surface layer of hydration is identified from the curve fitting of the O 1s core level, which would qualitatively account for the slight underestimate of film thickness provided by the expression for dxps. The validity of the Al 2p fit may be determined through this correlation of thickness but requires first a quantitative assessment of the thickness and composition of the hydroxide-rich layer. Copyright © 2002 John Wiley & Sons, Ltd.

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9 Peak Fitting with CasaXPS: A Casa Pocket Book

Walton, J., Wincott, P., Fairley, N. and Carrick, A., 2010.
Accolyte Science

Abstract

Peak fitting is one of the most commonly used post acquisition data analysis procedures in XPS, and also the most easily misused. Today the technique is being used in fields far removed from theoretical surface analysis and this volume attempts to encourage and help users from such fields to start out on processing their own data, and in particular to tackle the art of peak fitting, an essential skill in quantitative surface analysis.

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10 Cerium oxide nanoparticles with antioxidant capabilities and gadolinium integration for MRI contrast enhancement.

Eriksson, P., Tal, A.A., Skallberg, A., Brommesson, C., Hu, Z., Boyd, R.D., Olovsson, W., Fairley, N., Abrikosov, I.A., Zhang, X. and Uvdal, K., 2018.
Scientific Reports, 8(1), p.6999.

Abstract

The chelating gadolinium-complex is routinely used as magnetic resonance imaging (MRI) -contrast enhancer. However, several safety issues have recently been reported by FDA and PRAC. There is an urgent need for the next generation of safer MRI-contrast enhancers, with improved local contrast and targeting capabilities. Cerium oxide nanoparticles (CeNPs) are designed with fractions of up to 50% gadolinium to utilize the superior MRI-contrast properties of gadolinium. CeNPs are well-tolerated in vivo and have redox properties making them suitable for biomedical applications, for example scavenging purposes on the tissue- and cellular level and during tumor treatment to reduce in vivo inflammatory processes. Our near edge X-ray absorption fine structure (NEXAFS) studies show that implementation of gadolinium changes the initial co-existence of oxidation states Ce3+ and Ce4+ of cerium, thereby affecting the scavenging properties of the nanoparticles. Based on ab initio electronic structure calculations, we describe the most prominent spectral features for the respective oxidation states. The as-prepared gadolinium-implemented CeNPs are 3-5 nm in size, have r1-relaxivities between 7-13 mM-1s-1 and show clear antioxidative properties, all of which means they are promising theranostic agents for use in future biomedical applications.

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11 XPS and SEM-EDX Study of Electrolyte Nature Effect on Li Electrode in Lithium Metal Batteries.

Grissa, R., Fernandez, V., Fairley, N., Hamon, J., Stephant, N., Rolland, J., Bouchet, R., Lecuyer, M., Deschamps, M., Guyomard, D. and Moreau, P., 2018.
ACS Applied Energy Materials, 1(10), pp.5694-5702.

Abstract

Understanding the solid electrolyte interphase (SEI) in lithium batteries is very important to face the major safety issue of lithium dendritic growth during battery charge. The aim of this work is to study the thickness and the chemical nature of the SEI by XPS, as well as their influence on the electrochemical performance of the battery for different liquid organic electrolytes. XPS imaging is also used in this work to get a chemical mapping of the SEI layer components formed on the metallic lithium electrode surface cycled in different conditions. Data processing based on the principal component analysis (PCA) method has been conducted in order to illustrate the SEI layer heterogeneities. The obtained results are compared with energy-dispersive X-ray spectroscopy (EDX) mapping. Thereby, the benefits and the precision of the XPS imaging technique to identify chemical compounds distribution have been highlighted. These different analyses have led to a better knowledge of the redox processes occurring at the top surface of lithium metal electrodes cycled in different liquid electrolytes.

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12 Curve fitting complex X-ray photoelectron spectra of graphite-supported copper nanoparticles using informed line shapes.

Fernandez, V., Kiani, D., Fairley, N., Felpin, F.X. and Baltrusaitis, J., 2020.
Applied Surface Science, 505, p.143841.

Abstract

Complex spectral envelopes of transition metal photo-excitations obtained using X-ray Photoelectron Spectroscopy (XPS) contain extensive information on the oxidation states and chemical bonding but pose multiple challenges for extracting reliable data due to the presence of multiple closely lying binding energy peaks. In this work, we outlined a procedure for graphite supported copper nanoparticles (Cu NP/graphite) XPS data interpretation that involves constructing spectral envelopes of the potential copper components (Cu2O, CuO and Cu(OH)2) extracted from the diverse set of Cu NP/graphite samples and using Linear Least Squares (LLS) fitting to reconstruct the exact surface composition of Cu NP/graphite samples. We utilized Informed Amorphous Sample Model (IASM) to calculate spectral envelopes using a physical process affecting the series of Cu NP/graphite samples, namely their synthesis procedure, to construct an informed line shape necessary to complete data reproduction by the model. The method described herein can be used to interpret crucial XPS data obtained in many science and engineering disciplines, including chemistry, fundamental and applied surface science, catalysis, semiconductors and many others. A brief discussion is also provided on the opportunities and pitfalls of deriving standard model line shapes from user sourced online databases.

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13 Insight note: X-ray photoelectron spectroscopy (XPS) peak fitting of the Al 2p peak from electrically isolated aluminum foil with an oxide layer.

Lizarbe, A.J., Major, G.H., Fernandez, V., Fairley, N. and Linford, M.R., 2023.
Surface and Interface Analysis, 55(9), pp.651-657.

Abstract

X-ray photoelectron spectroscopy (XPS) is the most widely used and important method for chemically analyzing and speciating surfaces. XPS has surface sensitivity (5–10 nm), is quantitative, and is able to probe the oxidation states of the elements at surfaces. However, during the past few years, a great deal of incorrect XPS data analysis has entered the scientific literature. Accordingly, efforts, including this Insight Note, are being made to provide tutorial information to the scientific community. Aluminum is a scientifically and technologically important element. Here we discuss approaches for fitting the Al 2p peak envelope from a sample of aluminum foil with a thin layer of oxide on it. Signals from the metal and oxide are present. We discuss methods for electrically isolating (or not isolating) the sample during data acquisition, the choice of the baseline, fitting the oxide peak with one or two synthetic peaks, and fitting the metal signal with two symmetric or two asymmetric peaks. The thickness of the oxide is calculated based on the areas of the oxide and metal signals.

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14 Graphite-supported ultra-small copper nanoparticles - Preparation, characterization and catalysis applications.

d'Halluin, M., Mabit, T., Fairley, N., Fernandez, V., Gawande, M.B., Le Grognec, E. and Felpin, F.X., 2015.
Carbon, 93, pp.974-983.

Abstract

A convenient preparation of graphite-supported ultra-small copper nanoparticles (Cu NPs) has been developed. Ultra-small Cu NPs, generated by reduction of Cu(OAc)2 with H2, were well dispersed onto the graphite support and possess a very narrow distribution in size, ranging from 1.6 to 2.6 nm. The catalytic activity of these ultra-small graphite-supported Cu NPs was evaluated for the Meerwein arylation of pyrroles and the multicomponent synthesis of 1,2,3-triazoles via click reaction.

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15 Adsorption height determination of nonequivalent C and O species of PTCDA on Ag(110) using x-ray standing waves.

Mercurio, G., Bauer, O., Willenbockel, M., Fairley, N., Reckien, W., Schmitz, C.H., Fiedler, B., Soubatch, S., Bredow, T., Sokolowski, M. and Tautz, F.S., 2013.
Physical Review B—Condensed Matter and Materials Physics, 87(4), p.045421.

Abstract

The normal incidence x-ray standing wave (NIXSW) technique is used to determine the adsorption geometry of submonolayer 3,4,9,10-perylene tetracarboxylic dianhydride (PTCDA) adsorbed on the Ag(110) surface. An accurate analysis of both C1s and O1s photoemission (PE) spectra allows the respective adsorption heights of carbon and oxygen atoms in different chemical environments within PTCDA to be distinguished. Due to the intricacy of the PE fitting models, a systematic error analysis of NIXSW structural parameters was developed and employed. Based on the adsorption geometry of PTCDA on Ag(110) a bonding mechanism is discussed.

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16 Film thickness measurement and contamination layer correction for quantitative XPS.

Walton, J., Alexander, M.R., Fairley, N., Roach, P. and Shard, A.G., 2016.
Surface and Interface Analysis, 48(3), pp.164-172.

Abstract

In order to determine the most appropriate method of measuring film thickness using imaging XPS, a series of thin polymer films have been prepared and analysed using spectroscopy. The thickness of these thin polymer films has been determined using peak shape analysis and by using photoelectron peak areas compared with a bulk reference and by using relative sensitivity factors. These results have been compared with values obtained using ellipsometry. The values obtained by measuring photoelectron peak areas were seen to be influenced by the chemistry of the film, so that a bulk reference of similar chemistry to the film is required for accurate thickness measurement. The values obtained using peak shape analysis, both interactive and non-interactive, were not dependent on the chemistry of the film and showed good agreement with ellipsometry. Imaging of a patterned polymer film was successfully carried out, and the polymer cross section was shown to provide a reasonable description of the inelastic background from the carbonaceous contamination layer. An image of the substrate photoelectron intensity was successfully corrected for attenuation in both the carbonaceous contamination layer and the polymer film simultaneously using an image of the film thickness determined by non-interactive peak shape analysis. This procedure is suitable for automated film thickness measurement and correction for attenuation in the carbonaceous contamination layer in both spectroscopy and imaging. Copyright © 2016 John Wiley & Sons, Ltd.

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17 Noise reduction in X-ray photoelectron spectromicroscopy by a singular value decomposition sorting procedure.

Walton, J. and Fairley, N., 2005.
Journal of Electron Spectroscopy and Related Phenomena, 148(1), pp.29-40.

Abstract

In spite of the fact that most X-ray photoelectron spectroscopy (XPS) instruments are capable of acquiring multispectral data sets, few analysts choose to do so due to the time required to obtain an adequate signal to noise ratio. A significant reduction in the acquisition time can be achieved by the use of principal component analysis to reduce noise in the data set. Additionally a reduction in computational requirements of Principal Component Analysis (PCA) can be gained by prior application of a singular value decomposition sorting procedure. Data transformation prior to processing minimises the difficulties arising due to the non-uniform distribution of Poissonian noise through the spectra. The use of the procedure is illustrated to produce quantified elemental images from wide energy spectra, and chemical state maps requiring curve fitting to high energy resolution spectra. Finally we discuss the effect sample charging during analysis of insulators has on the images.

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18 Noise reduction procedures applied to XPS imaging of depth distribution of atoms on the nanoscale.

Hajati, S., Tougaard, S., Walton, J. and Fairley, N., 2008.
Surface science, 602(18), pp.3064-3070.

Abstract

We have studied the capability of a new method for 3D XPS imaging and have focused on the influence of noise in the spectra. To this end, we have studied a patterned structure made by thermally oxidising a silicon wafer. We have studied the O 1s, Si 2p and C 1s peaks which have rather low photoionization cross sections. In addition we have not used high spectrometer pass energy. Therefore, the signal-to-noise level for these spectra was very low. We have investigated the extent to which different noise reduction procedures can improve the quantitative images obtained. The original data has been processed using four different methods: (1) smoothing using a quadratic, 7-point Savitzky–Golay filtering followed by averaging the spectrum for each pixel with spectra from nearest neighbours (2) principal component analysis (PCA) (3) PCA followed by smoothing and (4) PCA followed first by smoothing and then by averaging. We have shown that for noisy spectra, PCA significantly improves the images of both the amount of substance (AOS) in the outermost few nanometers and also the XPS-images of the different in-depth distributions of oxygen, carbon and silicon atoms. The images of the depth profiles for the different elements in the sample studied are found to be consistent. This result is important because in imaging, data acquisition time is a limiting factor, which can be reduced by effective noise reduction procedures.

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19 An experimental investigation of diesel soot thermal-induced oxidation based on the chemical structure evolution.

Guo, Y., Horchler, E.J., Fairley, N., Stevanovic, S., Shang, J. and Ristovski, Z., 2022.
Carbon, 188, pp.246-253.

Abstract

Diesel particle emissions are a major environmental concern and understanding its oxidation mechanisms is essential for development of diesel particulate filters (DPF) regeneration strategy and the control of the secondary particle emissions produced during regeneration. This study used X-ray Photoemission Spectroscopy to examine the oxygen functional groups on the soot flake in sixteen partially oxidised soot samples generated under temperatures between 25 °C and 580 °C. We found that soot flake oxygen-containing functional groups evolution leads the oxidation. This study also compared the carbon skeleton of the secondary generated particles and original soot by using Raman spectroscopy, finding that the cleavage of the chemical bonds on the bridging sites contributes to the soot fragmentation thereby the secondary particle formation. It is concluded that oxygen-containing functional groups on the soot flake edge dominate the oxidation process thereby it is suggested as a major factor to consider for the DPF regeneration strategy development and secondary particle emission control.

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20 A detailed view of the Gaussian-Lorentzian sum and product functions and their comparison with the Voigt function.

Major, G.H., Fernandez, V., Fairley, N. and Linford, M.R., 2022.
Surface and Interface Analysis, 54(3), pp.262-269.

Abstract

The Gaussian-Lorentzian sum (GLS) and product (GLP) functions remain important in X-ray photoelectron spectroscopy (XPS) peak fitting. Here, we present a detailed view of these functions, comparing them with each other and with the Voigt function (the “LA(m)” function). First, we show the GLS, GLP, and LA(m) functions as a function of their mixing parameters, m, which reveals differences between them. We then illustrate the use of these functions to fit a series of spectra acquired at different pass energies (resolutions). Next, we show the underlying Gaussian and Lorentzian components of a series of GLS and GLP functions as a function of m, which confirms that the GLS is a simple linear combination of Gaussian and Lorentzian functions. However, one of the two functions used to make the GLP can be very wide, that is, at its extremes, one of these functions has infinite width. We then discuss a plot of the areas of the GLS, GLP, and LA(m) functions as a function of m, which reveals the expected, linear increase in area of the GLS, but nonlinear changes in the areas of the other two functions. Finally, to better understand them, we fit these functions to each other. These results indicate that the GLS and GLP better match the LA(m) function at lower and higher values of the mixing parameter, respectively.

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21 Surface analysis insight note: Differentiation methods applicable to noisy data for determination of sp2- versus sp3-hybridization of carbon allotropes and AES signal strengths.

Fairley, N., Compagnini, G., Scardaci, V., Baltrus, J., Roberts, A., Barlow, A., Cumpson, P. and Baltrusaitis, J., 2023.
Surface and Interface Analysis, 55(3), pp.165-175.

Abstract

The derivatives of the spectra are commonly used for quantification in Auger Electron Spectroscopy (AES) spectra, while the derivative of the KLL C Auger line has proven to be valuable in obtaining a measure of the relative proportions of sp2- and sp3-hybridization using the D-parameter in both AES and X-ray Photoelectron Spectroscopy (XPS). Differentiation of X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) spectra by numerical means is presented and illustrated for polymeric, such as PEEK and Nylon, as well as for graphitic materials including highly ordered pyrolytic graphite and graphene oxide. The most commonly available Savitzky–Golay method is explained mathematically and developed through the case of constructing a 5-point quadratic polynomial convolution kernel suitable for differentiating spectra of adequate signal to noise. The concept of differentiation of spectra where signal to noise is less than adequate is also developed. Two alternative strategies to Savitzky–Golay differentiation are presented, which fit curves to data that allow derivatives to be obtained where Savitzky–Golay would otherwise fail. These alternative methods involve constructing a parametric curve that fits data over the entire energy interval of interest. Derivatives of spectra are then obtained by differentiating these parametric curves directly. A comparison of results for different materials for which specific sp2- vs sp3-hybridized carbon proportions are of interest is used to emphasize the importance of characterizing methods used to differentiate spectra and understanding the characteristics of instrumentation used to measure spectra. The case for using Principal Component Analysis noise reduction with C KLL spectra is made for spectra collected from a heterogeneous graphene oxide sample.

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22 XPS of chemically modified low-density polyethylene surfaces: observations on curve-fitting the C 1s spectrum.

Briggs, D. and Fairley, N., 2002.
Surface and Interface Analysis: An International Journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films, 33(3), pp.283-290.

Abstract

The curve-fitting of the complex C 1s envelopes (obtained under high-energy-resolution XPS conditions) resulting from the surface chemical modification of low-density polyethylene has been investigated. The main problem is modelling of the dominant, asymmetric component due to unmodified hydrocarbon. Two approaches have been compared, namely the use of a full (four-component) vibrational progression or a single peak with a lineshape recently introduced by Gelius. As well as goodness of fit criteria, the agreement between the measured O 1s intensity and that predicted from the intensities of the high-binding-energy C 1s components (from oxygen-containing functional groups) was used in the assessment. Under the relatively low-level, but practically relevant, modification conditions studied, the two approaches are equally effective. However, they can give rise to significant differences in the relative intensities of high-binding-energy components. Broadening of the various components as a function of treatment also has been studied. Copyright © 2002 John Wiley & Sons, Ltd.

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23 Developments in numerical treatments for large data sets of XPS images.

Béchu, S., Richard-Plouet, M., Fernandez, V., Walton, J. and Fairley, N., 2016.
Surface and interface analysis, 48(5), pp.301-309.

Abstract

Empirical data include signal with superimposed variations in intensity of an unwanted nature. These signal fluctuations are of particular interest in XPS measurements when the data are partitioned into both spatial and energy collection bins. In separating signals into a data cube with axes of energy and displacement in x and y, this division creates many more data binning locations than is typical of spectroscopy or classical imaging-type measurements resulting in only small numbers of counts per data bin. Under these circumstances, errors can easily dominate the signal of interest. It is usually assumed that pulse counted data have Poissonian statistics, so that the magnitude of the noise is proportional to the square root of the number of counts. When data are distributed throughout a 3D cube, the counts per voxel are typically low and any random errors can cause deviation from the expected Poisson distributed intensities, which has consequences for data treatment. This paper shows how raw intensities from 3D data sets can be preprocessed to recover a pseudo-Poisson behaviour, which allows principal component analysis with prior data scaling to be used to process the data. Data acquired from crystal formations on photosensitive films based on titanium clusters are used to demonstrate these techniques. Copyright © 2016 John Wiley & Sons, Ltd.

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24 Unraveling spectral shapes of adventitious carbon on gold using a time-resolved high-resolution X-ray photoelectron spectroscopy and principal component analysis.

Fernandez, V., Fairley, N. and Baltrusaitis, J., 2021.
Applied Surface Science, 538, p.148031.

Abstract

To extract chemical information reliably, we propose a new data processing method based both on the creation of information vectors and on a vector base change. The originality of this method is the combination of the different core XPS peaks, Auger and/or valence bands in a single vector. We show that the measurement of a sample upon its progressive chemical change, such as accumulation of the adventitious carbon, allows us to create a new vector basis using linear algebra and Principal Component Analysis. We demonstrate the application of this method using adventitious carbon films on Au foil utilizing Au 4f, C 1s and O 1s spectral envelopes. This method expands the possibilities of XPS measured chemical environment analysis and is an operator-unbiased solution for materials for which the reference XPS spectra are not available. In this demonstration, the emphasis is placed on identifying changes in a C 1s peak assumed to be adventitious carbon and highlight uncertainties associated with calibrating the binding energy scale using a simple peak model to identify a component C 1s assumed to be saturated hydrocarbon in origin.

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25 Towards a reliable assessment of charging effects during surface analysis: Accurate spectral shapes of ZrO2 and Pd/ZrO2 via X-ray Photoelectron Spectroscopy

Bargiela, P., Fernandez, V., Cardinaud, C., Walton, J., Greiner, M., Morgan, D., Fairley, N. and Baltrusaitis, J., 2021.
Applied Surface Science, 566, p.150728.

Abstract

X-ray Photoelectron Spectroscopy of large bandgap or insulating material surfaces relies on an effective mechanism that compensates for the emission (loss) of electrons by maintaining the material surface at a steady-state uniform potential. While a steady-state may be attained by utilizing an active compensation, such as low power electron emitting filament, there is the possibility that the surface potential is not uniform over the area analyzed, leading to peak shifts and incorrect spectral interpretation. In this work, a spectral data processing method based on mapping the ZrO2 and Pd/ZrO2 surfaces utilizing photoemission peak binding energy is proposed, which provides information about the response of specific material surfaces to charge compensation. Spectromicroscopy of ZrO2 and Pd/ZrO2 surfaces without spatial information is used to monitor the efficacy of charge compensation. Exploiting counts distributed over many bins require the use of procedures and algorithms essential to practical mapping peak positions. Iterative singular value decomposition is therefore introduced and utilized as a means of efficiently delivering spatially resolved spectra from which binding energy for peaks is computed. The concepts developed in this work result in robust and accurate peak models of ZrO2 and Pd/ZrO2 that can be applied in XPS analysis of not only ZrO2 but other large bandgap or insulating material surfaces. Supporting arguments for a peak model representing signal from Zr 3p and Pd 3d are developed within this work are presented.

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26 Application of XPS imaging analysis in understanding interfacial delamination and X-ray radiation degradation of PMMA.

Piao, H., Fairley, N. and Walton, J., 2013.
Surface and interface analysis, 45(11-12), pp.1742-1750.

Abstract

The recent development of X-ray Photoelectron Spectroscopy (XPS) instrumentation with spatial resolution down to several microns has advanced the capability of elemental and chemical state imaging. XPS imaging analysis has been applied in understanding the delamination problems of siloxane coatings on polymethyl-methacrylate (PMMA) polymer. It was found that delamination occurred by interfacial failure, and the coating suffered complete delamination from a PMMA substrate. This example offered an opportunity for the investigation of X-ray damage on polymers encountered in XPS imaging analysis. This paper also demonstrated how to construct a constrained peak model with the aid of chemical knowledge and supporting evidence of the sample. Monte Carlo error analysis was used to determine the validity of the peak fit models used. Copyright © 2013 John Wiley & Sons, Ltd.

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27 Quantitative surface chemical-state microscopy by x-ray photoelectron spectroscopy.

Walton, J. and Fairley, N., 2004.
Surface and Interface Analysis: An International Journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films, 36(1), pp.89-91.

Abstract

The realization of surface chemical-state microscopy by x-ray photoelectron spectroscopy requires the resolution of overlapped chemical states, an adequate background description and the ability to quantify data. This can be achieved only by the acquisition and analysis of multi spectral data sets. Here we describe the software to perform this analysis, which is capable of allowing for small amounts of differential charging and for incorporation of knowledge about the sample. We demonstrate its use on a patterned silicon dioxide on silicon sample, and suggest ways to reduce oversampling and therefore acquisition times. Copyright © 2004 John Wiley & Sons, Ltd.

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28 Determination of the X-Auger electron spectroscopy evolution of indium in InSb by linear and nonlinear least squares approaches.

Béchu, S. and Fairley, N., 2024.
Journal of Vacuum Science & Technology A, 42(1).

Abstract

X-ray photoelectron spectroscopy is a major and valuable chemical analysis technique that can bring a wide range of information if one takes time to carefully interpret the spectra. In particular, many metrological developments deal with the modeling of photoelectron peaks while X-Auger transitions still remain hardly exploited. Here, an innovative approach examining these spectral features in a complementary way is presented and illustrated on a concrete case dealing with chemical changes of indium in the InSb semiconductor during its air aging. Indium contains an extensive range of photopeaks along the energy scale, meaning electrons emitted from different escape depths are present on the same widescan spectrum, and, thus, information from different depths is accessible. Specifically, this study focuses on indium's X-Auger electron spectroscopy (X-AES) transitions and decomposition to track the outer surface chemistry evolution of the InSb semiconductor. To this end, we compared linear and nonlinear least-squares approaches to decompose In M4,5N4,5N4,5 X-AES transition and demonstrate oxide growth progression. For both approaches, we applied the vectorial method (also known as the informed amorphous sample model) to retrieve the different chemical environments present during air aging. Linear and nonlinear least-squares approaches were both found to yield comparable results, with a comparative error of less than 10%. Over time, a progressive growth of the oxide layer was demonstrated, ranging from 0.3 ± 0.2 to 2.9 ± 0.2 nm using the X-AES transitions. Additionally, decomposition of the In 3d and In 4d photoelectron peaks showed a lower thickness of oxide with time due to the lesser surface sensitivity of these peaks.

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29 Further developments in quantitative X-ray photoelectron spectromicroscopy: preliminary results from the study of germanium corrosion.

Smith, E.F., Briggs, D. and Fairley, N., 2006.
Surface and Interface Analysis: An International Journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films, 38(2), pp.69-75.

Abstract

The moisture-induced corrosion of an evaporated germanium film has been observed and studied using quantitative X-ray photoelectron spectromicroscopy. The application of recently reported software for the processing of multi-spectral image datasets (particularly noise reduction) to this real-world problem revealed the formation of oxide islands above the continuous passive oxide layer. The software has been developed to map the thickness of these structures within the XPS sampling depth, with a spatial resolution of a few microns. This exemplifies a characterisation methodology of use in any situation where (non-uniform) surface modification results in chemically shifted components of the same core level (or Auger peak) between the original substrate and new overlayer. Copyright © 2005 John Wiley & Sons, Ltd.

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30 Multi-scale characterization of a chromium-free passivation layer for tinplate food-packaging.

Ros, E., Fernandez, V., Gautron, E., Fairley, N., Merabet, A., Souron, E., Turgis, J.D., Humbert, B. and Caldes, M.T., 2025.
Applied Surface Science, p.165498.

Abstract

The ban on the use of hexavalent chromium in the protection process for food-grade tinplate has led to the development of a new passivation process called CFPA (Chromium-Free Passivation Alternative). Nevertheless, its corrosion performance is lower than that of the original process. The objective of this work is to thoroughly characterize the 555-CFPA layer in order to identify the origin of the adhesion and corrosion weaknesses observed. To achieve this, XPS spectroscopy in conventional and image mode and STEM HAADF imaging combined with EELS spectroscopy were used. A “ridge-valley” nano-roughness following the rolling patterns was observed. The thickness of the passivation layer is dependent upon its location and varies from single (∼8 nm) to double (∼18 nm). In the valleys, the passivation consists of a gradient of transition metal oxides or even (oxy)fluorides and a polymer on the surface, arranged on a protective layer of tin oxides. On the ridges, the thinner passivation layer consists of a single nano-layer of oxides. Its lateral distribution is very heterogeneous, even leading to the formation of nano-clusters at the extreme surface. Indeed, the chemical heterogeneity in passivated tinplate leads to variations in chemical potential at the surface, which could lead to different responses to corrosion and weakened steel protection.

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31 Coupling of X-AES Transitions and XPS Photopeaks to Assess the Oxide Formation of Ga and in CuIn0.7Ga0.3Se2 Material During Air Aging.

Gagliardi, A., Fairley, N., Rebai, A., Etcheberry, A., Naghavi, N., Guillemoles, J.F., Bouttemy, M. and Béchu, S., 2025.
Surface and Interface Analysis, 57(4), pp.291-299.

Abstract

The solar absorber Cu (In0.7Ga0.3)Se2 (CIGS) undergoes a process of evolution upon exposure to the atmosphere, resulting in the growth of oxide phases. This phenomenon can potentially affect the interfacial properties of CIGS, which in consequence may impact the efficiency of the solar cell. X-ray photoelectron spectroscopy (XPS) is an appropriate method to analyze the degradation of CIGS upon air aging. However, many photopeaks and Auger lines of the constitutive elements are distributed along the energy scale, and the exact determination of the degradation within the CIGS absorber requires specific care to select peaks to consider to ensure that information arise from similar escape depths. In this study, we propose to investigate the kinetics of degradation of Ga and In at similar depths probed by coupling not only photopeaks but also X-Auger electron spectroscopy (X-AES) transitions in the absence of photopeaks in the same energy range. If photopeaks modeling is well established for In and Ga, a decomposition procedure of the X-AES transitions must be developed. Both linear and nonlinear least square fitting were used and compared, starting to model CIGS, In2O3, and Ga2O3 references to deploy it after on Auger transitions measured on aged samples. Thanks to the determination of the degradation ratios (oxide phase over CIGS phase) at 3, 7, and 9 nm depth, we show that both In and Ga exhibit similar kinetic of oxide formation, which proceeds gradually by O penetration through the subsurface of the material, this penetration being more and more attenuated deeper.

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32 Surface science insight note: Optimizing XPS instrument performance for quantification of spectra.

Fernandez, V., Renault, O., Fairley, N. and Baltrusaitis, J., 2024.
Surface and Interface Analysis, 56(7), pp.468-478.

Abstract

X-ray photoelectron spectroscopy (XPS) provides quantitative information from photoemission peaks and shapes observed within the background due to the inelastic scattering of photoelectrons. To quantify the signal, both photoemission peaks and background in spectra must be adjusted for instrumental transmission variations that are a consequence of changes in efficiency when recording electrons with different kinetic energy. While it is generally assumed that correcting spectroscopic data for transmission is a necessary part of quantification by XPS, there are consequences for the quantification of spectra measured using an instrument for which transmission has significant curvature. In this Insight, the implications of curvature in transmission characteristics are discussed and a method based on XPS microscopy is proposed that ensures the transmission response of an instrument is free from significant curvature. An example of an instrument for which a flat transmission response is presented is achieved through collecting spectra using lens modes designed to measure stigmatic images.

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33 Surface Analysis Insight Note: Observations relating to photoemission peak shapes, oxidation state, and chemistry of titanium oxide films.

Bargiela, P., Fernandez, V., Ravisy, W., Morgan, D., Richard-Plouet, M., Fairley, N. and Baltrusaitis, J., 2024.
Surface Analysis Insight Note: Observations relating to photoemission peak shapes, oxidation state, and chemistry of titanium oxide films. Surface and Interface Analysis, 56(4), pp.181-188.

Abstract

It is common practice to describe the coordination of metal atoms in a binding configuration with their nearest neighbors in terms of oxidation state, a measure by which the number of electrons redistributed between atoms forming chemical bonds. In XPS terms, change to an oxidation state is commonly inferred by correlating photoemission signal with binding energy. The assumption, when classifying photoemission signals into distinct spectral shapes, is that a distribution of intensities shifted to lower binding energy is evidence of a reduction in oxidation state. In this Insight note, we raise the prospect that changes in photoemission peak shape may occur without obvious changes, determined by XPS in stoichiometry for a material. It is well known that TiO2 measured by XPS yields reproducible Ti 2p photoemission peaks. However, on exposing TiO2 to ion beams, Ti 2p photoemission evolves to complex distributions in intensity, which are particularly difficult to analyze by traditional fitting of bell-shaped curves to these data. For these reasons, in this Insight note, a thin film of TiO2 deposited on a silicon substrate is chosen for analysis by XPS and linear algebraic techniques. Alterations in spectral shapes created from modified TiO2, which might be interpreted as the change in oxidation state, are assessed in terms of relative proportions of titanium to oxygen. It is found through detailed analysis of spectra that quantification by XPS, using procedures routinely used in practice, is not in accord with the typical interpretations of photoemission shapes. The data processing methods used and results presented in this work are of particular relevance to elucidating fundamental phenomena governing the surface evolution of materials-enabled energy processes where cyclic/non-steady usage changes the nature of bonding, especially in the presence of contaminants.

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34 Characterisation of the Kratos Axis Ultra with spherical mirror analyser for XPS imaging.

Walton, J. and Fairley, N., 2006.
Surface and Interface Analysis: An International Journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films, 38(8), pp.1230-1235.

Abstract

The imaging performance of an XPS instrument employing a spherical mirror electron energy analyser has been characterised by measuring the peak position, full width at half maximum (FWHM), and lineshape, at every pixel in the image, for different modes of operation. Changes in these parameters have been identified and recommendations made for quantification of, and chemical state determination from, spectrum image data sets. Copyright © 2006 John Wiley & Sons, Ltd.

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35 XPS spectromicroscopy: exploiting the relationship between images and spectra.

Walton, J. and Fairley, N., 2008.
Surface and Interface Analysis: An International Journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films, 40(3-4), pp.478-481.

Abstract

The application of spectroscopic processing techniques to multi-spectral XPS data sets has enabled the acquisition of quantitative surface chemical state images. Such data sets are necessarily large, incorporating many spectra, so prohibiting interactive processing. Instead multivariate analytical techniques are used to reduce the dimensionality of the data, and also to increase the signal/noise, there bye speeding acquisition. These techniques may also be used to classify regions in images according to different chemistry, that is changes in photoelectron intensity, changes in binding energy and changes in the inelastic background. Spectra from classified regions may then be summed to aid visualisation, obviating the need for multivariate curve resolution with its attendant uncertainties. Further the inelastic background of transmission corrected spectra from classified regions may be modelled to provide spatially resolved in-depth information. Such classification also aids curve fitting, since curve fit models can be applied to regions of similar chemistry. Copyright © 2008 John Wiley & Sons, Ltd.

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36 Correlating chemical and electronic states from quantitative photoemission electron microscopy of transition-metal dichalcogenide heterostructures.

Renault, O., Kim, H., Dumcenco, D., Unuchek, D., Chevalier, N., Gay, M., Kis, A. and Fairley, N., 2021.
Journal of Vacuum Science & Technology A, 39(5).

Abstract

Vertical heterostructures of MoS2 and WSe2 layers are studied by spectroscopic photoemission electron microscopy as an effective technique for correlating chemical and electronic states at the micrometer scale. Element-specific, surface-sensitive images recorded at high lateral and energy resolution from core-level photoelectrons using different laboratory excitation sources are postprocessed to obtain laterally resolved maps of elemental composition and energy shifts in the Mo3d spectra of a few hundred meV. For monolayer MoS2, the method reveals substrate-dependent charge transfer properties within the narrow energy range of 360 meV, with MoS2 becoming more n-type after transfer onto WSe2. The band structure data from momentum microscopy taken over the same areas confirm the charge transfer from WSe2 to MoS2 by the shift of the K-bands away from the Fermi level and illustrates the layer-specific contributions to the electronic band structure of the heterostructure. From work function mapping, the reconstructed energy-level diagram reveals a type II heterostructure but with a very small conduction-band offset.

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37 Cryolitic vein XPS imaging from an industrial grade carbon.

Coulombe, M.A., Lebeuf, M., Fairley, N., Walton, J. and Soucy, G., 2012.
Journal of Electron Spectroscopy and Related Phenomena, 185(12), pp.588-597.

Abstract

Aluminium carbide formation and subsequent dissolution is a generally accepted mechanism to explain the cathode wear in the Hall-Héroult industry. Carbide formation is thought to occur inside the cathode pores. Being dependent upon cathodic current density, it is believed to be an electrochemical process. It is also associated with the presence of cryolitic bath species involved in the dissolution of the carbide layer and thus enabling further carbide formation. X-Ray Photoelectron Spectroscopy imaging has the capacity to illustrate both the species chemistry and the spatial localization of such species. However, spectroscopic imaging requires long acquisition time. The value of mathematical treatment becomes obvious when applying multivariate data analysis on raw data. Principal Component Analysis (PCA) can substantially reduce the collection time without reducing the analysis quality of the data. In the current work, the C 1s photoelectron region was imaged and aluminium carbide (Al4C3), aluminium oxycarbide (Al4O4C and Al2OC), and graphite (C) were spatially tracked within the first millimetres under the cathode block surface. Preliminary work on differentiating between cryolite (Na3AlF6), alumina (Al2O3), and Al4C3 in the Al 2p narrow scan regions was conducted. More generally, the XPS analysis enabled further investigation of the chemical species present in bath penetrated veins of the carbon cathode.

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38 A traceable quantification procedure for a multi-mode X-ray photoelectron spectrometer.

Walton, J. and Fairley, N., 2006.
Journal of electron spectroscopy and related phenomena, 150(1), pp.15-20.

Abstract

A modification to the quantification procedure used by a multi-mode X-ray photoelectron spectrometer (XPS) instrument is described which enables transfer of quantification between instruments, and which is referenced to a verified source. The procedure takes account of the intensity/energy response function of the instrument, which is appended to the data file, eliminating ambiguities in intensity calibration at a later date, and allowing background subtraction techniques based on electron scattering to be used on corrected spectra. A strategy is proposed to minimise inaccuracies arising from surface contamination and low signal intensity. Use of the procedure is illustrated by comparing quantification using different data processing software.

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39 Surface science insight note: Imaging X-ray photoelectron spectroscopy.

Fernandez, V., Fairley, N., Morgan, D., Bargiela, P. and Baltrusaitis, J., 2024.
Surface and Interface Analysis, 56(10), pp.669-680.

Abstract

Quantification of X-ray photoelectron spectroscopy (XPS) data is often limited by the heterogeneous nature of the material surface. However, it is often the case that heterogeneous material contains areas within the analyzed area that are effectively homogeneous. In this Insight note, concepts, and methods used to analyze both XPS data are presented to extract both spatial and spectral information from heterogeneous surfaces. These concepts and methods are applied to a specific material surface that contains three chemical compounds separated spatially. The analysis entails converting XPS image data to spectral data and is designed to highlight the potential of XPS imaging in revealing compositional information correlation with spatial information. Properties of algorithms used to evaluate XPS images and spectra are described to outline their application to image data. A case study of an imaging XPS data set is presented that demonstrates how poor signal-to-noise images, where the signal is recorded for 4 s per image, are still open to analysis yielding useful information. Ultimately, the methods presented here will aid in interpreting complex XPS data obtained from spatially complex materials often obtained during extensive cycling, such as conventional or electrocatalysts.

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40 Surface chemistry of ion beam modified native titania/Ti interfaces examined using X-ray photoelectron spectroscopy.

Bargiela, P., Fernandez, V., Morgan, D., Richard-Plouet, M., Fairley, N. and Baltrusaitis, J., 2024.
Results in Surfaces and Interfaces, 15, p.100231.

Abstract

It is often assumed in X-ray Photoelectron Spectroscopy that binding energy shifts are synonymous with changes in the chemical state of an atom and the chemical state can be described in terms of oxidation state and stoichiometry of the elements in a material that correlates with photoemission peaks. However, when an atom is bonded into a crystal lattice, the shapes and binding energy of photoemission may not match the expected stoichiometry when measured by XPS, even though shifts in binding energy suggest new oxidation states. In this work, a set of experiments is presented, in which Ar+ and He+ ions of different energies modify the native oxide on a titanium foil which yields XPS spectra that are not easily open to analysis by conventional peak models. In the course of analyzing these complex photoemission data by linear algebraic methods, the prospect emerged that XPS is suggesting that sputtering a native oxide may be providing insight into structural perturbation in addition to the stoichiometry-type changes to the native oxide.

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41 Data scaling for quantitative imaging XPS.

Walton, J. and Fairley, N., 2009.
Surface and Interface Analysis: An International Journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films, 41(2), pp.114-118.

Abstract

XPS spectrum image data sets acquired on laboratory instruments have inherently poor signal/noise, and require the use of multivariate analytical techniques to avoid prohibitively long acquisition times. However, when procedures that order the data by variance are used, the data set must be scaled beforehand, since it has a Poisson distribution. Different scaling methods may be used, but their effectiveness in allowing a separation of the chemical information from the noise is critical if loss of information is to be avoided. The performance of three methods, square root, root mean square and optimal scaling, has been compared, and their effectiveness for quantitative photoelectron spectromicroscopy is discussed. Copyright © 2008 John Wiley & Sons, Ltd.

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42 Surface science insight note: A linear algebraic approach to elucidate native films on Fe3O4 surface.

Bargiela, P., Fernandez, V., Morgan, D., Fairley, N. and Baltrusaitis, J., 2024.
Surface and Interface Analysis, 56(4), pp.189-199.

Abstract

Standard materials are often used to obtain spectra that can be compared to those from unknown samples. Spectra measured from these known substances are also used as a means of computing sensitivity factors to allow quantification by X-ray photoelectron spectroscopy (XPS) of less well-defined materials. Spectra from known materials also provide line shapes suitable for inclusion in spectral models which, when fitted to spectra, permit the chemical state for a sample to be assessed. Both types of information depend on isolating photoemission signals from the inelastically scattered signal. In this Insight note, technical issues associated with the use of XPS of as received Fe3O4 powder sample surface are discussed. The Insight note is designed to show how linear algebraic techniques applied to data collected from a sample marketed as pure Fe3O4 powder are used to verify that XPS has been performed on chemistry representative of the sample. The methods described in this Insight note can further be utilized in elucidating complex XPS data obtained from thin films formed or evolved during cyclic/non-steady use of complex (electro)catalyst surfaces, especially in the presence of contaminants.

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43 Theoretical studies of 1s2snl and 1s2pnl quartet levels of Li I.

Fairley, N.A. and Laughlin, C., 1984.
Journal of Physics B: Atomic and Molecular Physics, 17(14), p.2757.

Abstract

Radiative properties of 1s2snl and 1s2pnl quartet levels of the neutral lithium atom are studied with the framework of a model-potential method, in which the K-shell electron is represented by a non-local effective potential. Convergence of configuration-interaction expansions for the wavefunctions is examined and it is found that continuum configurations often make important contributions. Two practical approaches to including such configurations are investigated. Transition wavelengths and probabilities, and radiative lifetimes, are calculated and compared with recent experimental values. Fine-structure-induced autoionisation of 4P and 4D0 levels above the 2s 3S ionisation limit of Li II is briefly discussed.

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44 Deriving Stable Peak Models to Fit Complex XPS Data From Cu Contaminated Pt Electrocatalysts.

Saini, S., Bargiela, P., Fernandez, V., Fairley, N., Parvin, S., Lee, S., Weber, J., McDowell, M.T. and Baltrusaitis, J., 2025.
Surface and Interface Analysis, 57(6), pp.455-469.

Abstract

X-ray Photoelectron Spectroscopy spectra peak models, designed to partition photoemission signals emanating from different elements or chemical states within an atom, are fitted to data limited to an energy interval over which inelastically scattered photoemission signal can be estimated. While the choice of background approximation and line shapes of components to the peak model requires careful consideration, the energy interval used to define the data to which the peak model is optimized has a significant impact on the final peak model. The relationship between the background intensity and data intensity at the start and end of the energy interval dictates the line shapes used in the peak model. In this work, we devise a method to peak fit a complex overlapping Cu 3p and Pt 4f XPS peak structure to perform the elemental quantification. We first use an Al 2s peak to illustrate how background curves approach data at the limits of the energy interval over which the background is defined, influencing the analysis of XPS spectra. Next, we demonstrate the nature of interactions between specific line shapes (Voigt and pseudo-Voigt profiles) suitable for photoemission peaks and a specific background curve (Shirley) and a peak model is presented that includes components to the peak model that accommodates background intensity during fitting of the peak model to data. The peak model allowed for quantification of the contributions of Pt 4f peaks emanating from the substrate that exhibits strong asymmetry in the presence of the inhomogeneously distributed Cu species, mostly of Lorentzian character.

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45 Surface science insight note: Charge compensation and charge correction in X-ray photoelectron spectroscopy.

Mendoza-Sánchez, B., Fernandez, V., Bargiela, P., Fairley, N. and Baltrusaitis, J., 2024.
Surface and Interface Analysis, 56(8), pp.525-531.

Abstract

Strategies to deal with sample charging effects on X-ray photoelectron spectroscopy (XPS) spectra are presented. These strategies combine charge compensation (or lack of) via a flow of electrons and an electrical connection (or lack of) of samples to the ground. Practical examples involving samples with a range of different electrical properties, sample structure/composition and sensitivity to X-rays, illustrate the correlation between sample properties, measurement strategies, and the resulting XPS data. The most appropriate measurement strategy for a particular sample is also recommended. We highlight the crucial importance of appropriate XPS data acquisition to obtain a correct data interpretation.

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46 Transmission-function correction for XPS spectrum imaging.

Walton, J. and Fairley, N., 2006.
Surface and Interface Analysis: An International Journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films, 38(4), pp.388-391.

Abstract

A procedure is described to characterise the performance of an imaging X-ray photoelectron spectroscopy (XPS) instrument and to determine the intensity/energy response function at each pixel in an image, to provide traceable quantification and chemical-state information from spectrum image data sets. Copyright © 2006 John Wiley & Sons, Ltd.

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47 Surface analysis insight note: Illustrating the effect of adventitious contamination on Pt photoemission peak intensities.

Fairley, N., Bargiela, P. and Baltrusaitis, J., 2024.
Surface and Interface Analysis, 56(2), pp.122-125.

Abstract

Adventitious carbon contaminations are not only omnipresent and used for charge referencing of XPS spectra but also can alter the apparent presence of the element peaks that span over the large spectral window of binding energies. This Insight note describes the effect of an adventitious contamination layer on Pt and presents, in brief, the approach whereby the component spectra are derived for ion beam cleaned Pt samples that can then utilize linear mathematics to peak fit said spectra thus quantifying the amount of each component including that assigned to the contamination itself of Pt metal.

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48 Modification of conventional peak shapes to accurately represent spectral asymmetry: High-Resolution X-ray photoelectron spectra of [C4C1Pyrr][NTf2] and [C8C1Im][NTf2] ionic liquids.

Smith, E., Fairley, N., Licence, P., Jones, R. and Baltrusaitis, J., 2023.
Applied Surface Science, 611, p.155314.

Abstract

X-ray photoelectron spectroscopy (XPS) is one of the most widely used techniques for surface characterization. Analysis of XPS data is challenging and requires the analyst to fit the data with synthetic line shapes to reach physically meaningful interpretations. Experimental spectral envelopes, however, are complex and display asymmetric features that are often ignored or attributed to additional chemical components. The high-resolution XPS spectra of [C4C1Pyrr][NTf2] and [C8C1Im][NTf2] all exhibit a degree of asymmetry which is systematically observed at the higher binding energy side of photoemission envelopes. We present the development of a refined fitting procedure for XPS spectra of these ionic liquid-based systems which include (a) Shirley background offset necessary to account for the insulator-like region and (b) spectral asymmetry in C 1s and N 1s regions. Further, Shirley and trapezoid components are applied to compensate for inelastic scattering taking place during electron transitions as high as 7.8 eV above the start of the fitting region in C 1s high-resolution spectrum. To demonstrate the fitness of this model, we present an analysis of a 2:1 mixture of [C4C1Pyrr][NTf2]: [C8C1Im][NTf2].

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49 Summary of ISO/TC 201 International Standard ISO 18516:2019 Surface chemical analysis—Determination of lateral resolution and sharpness in beam-based methods with a range from nanometres to micrometres and its implementation for imaging laboratory X-ray photoelectron spectrometers (XPS).

Unger, W.E., Senoner, M., Stockmann, J.M., Fernandez, V., Fairley, N., Passiu, C., Spencer, N.D. and Rossi, A., 2022.
Surface and interface analysis, 54(4), pp.320-327.

Abstract

ISO 18516:2019 Surface chemical analysis—Determination of lateral resolution and sharpness in beam-based methods with a range from nanometres to micrometres revises ISO 18516:2006 Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Determination of lateral resolution. It implements three different methods delivering parameters useful to express the lateral resolution: (1) the straight edge method, (2) the narrow line method and (3) the grating method. The theoretical background of these methods is introduced in ISO/TR 19319:2013 Surface chemical analysis—Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods. The revised International Standard ISO 18516 delivers standardized procedures for the determination of the (1) effective lateral resolution by imaging of square-wave gratings, the (2) lateral resolution expressed as the parameter D12-88 characterizing the steepness of the sigmoidal edge spread function (ESF) determined by imaging a straight edge and (3) the lateral resolution expressed as the full width of half maximum of the line spread function (LSF), wLSF, determined by imaging a narrow line. The last method also delivers information on the shape of the LSF, which characterizes an individual imaging instrument. Finally, the implementation of all three standardized methods in the field of imaging laboratory X-ray photoelectron spectroscopy (XPS) is shortly presented. This part of the letter is based on the use of a new test sample developed at ETH Zurich, Switzerland. This test sample displays a micrometre scaled pattern motivated by the resolving power of recent imaging XPS instruments.

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50 Aluminum Oxide Films and Sapphire Demonstrate Interaction of Sample Preparation and Instrumentation for XPS Measurements of Layered Materials.

Bargiela, P., Fairley, N., Baltrusaitis, J. and Fernandez, V., 2025.
Surface and Interface Analysis, 57(9), pp.739-750.

Abstract

Layered materials have multiple applications in electronics and energy storage, including gate dielectrics, diffusion barriers, surface coatings, and other devices. X-ray photoelectron spectroscopy (XPS) is often used to characterize the chemistry of layered materials. However, before meaningful analysis of materials can be made by XPS, there is a need to investigate how a particular sample interacts with XPS instrumentation. Thin aluminum oxide films are promising optoelectronic materials due to their optical, chemical, and electrical properties. In this work, an example of aluminum foil is used to demonstrate the consequences of choices made when XPS is performed on a material with an oxide overlayer on a bulk metal substrate. The results presented demonstrate how these choices alter the spectra measured, and through extended periods of acquisition cycles, the response of a sample to XPS can be characterized, understood, and mitigated by experimental design and appropriate peak model construction.

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51 Wavelengths, transition probabilities and lifetimes in the quartet spectra of O VI and F VII.

Laughlin, C. and Fairley, N.A., 1987.
Zeitschrift für Physik D Atoms, Molecules and Clusters, 5(2), pp.91-96.

Abstract

A model-potential method is employed to describe core-excited 1s2snl4 L and 1s2pnl4 L levels of the ions O VI and F VII. Wavelength, transition probability and lifetime data are predicted. The calculated wavelengths and lifetimes are compared with the available experimental measurements.

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52 Understanding delamination in microelectronic devices using AES, XPS and chemometrics.

Piao, H., Le Tarte, L., Hennessy, W.A. and Fairley, N., 2007.
Surface and Interface Analysis: An International Journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films, 39(6), pp.493-500

Abstract

The recent development of XPS instrumentation with near-micron spatial resolution has advanced the capability of elemental and chemical-state imaging accompanied by small-area analysis (down to 15 µm). In this paper, the combined use of X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES) at enhanced spatial resolution is shown to have significantly improved the understanding of interfacial delamination and related problems encountered in the production of electronic devices in the field of microelectronics. An example of the application of surface analysis for ITO/Mo adhesion problems will be presented. The mathematical procedure using principal component analysis (PCA) in the reduction of noise in XPS images will also be described. The dramatic improvements in the image contrast and chemical component determination from multispectral image data sets will be presented. This study is intended to explore the contributions given by advanced surface analysis tools to solve real-world problems. Copyright © 2007 John Wiley & Sons, Ltd.

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53 Calculations on the Quartet Spectrum of B III.

Fairley, N.A. and Laughlin, C., 1985.
Physica Scripta, 32(1), p.81.

Abstract

A model-potential technique is used to calculated wave functions and energy eigenvalues for quartet levels of B III. Transition wavelengths and probabilities, oscillator strengths and radiative decay lifetimes are presented. Some assignments which have been proposed for lines observed in beam-foil spectra of boron are confirmed but it is suggested that some lines have been incorrectly classified.

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54 Vectorial method used to monitor an evolving system: Titanium oxide thin films under UV illumination.

Béchu, S., Humbert, B., Fernandez, V., Fairley, N. and Richard-Plouet, M., 2018.
Applied Surface Science, 447, pp.528-534.

Abstract

Under in situ UV illumination, some materials present evolution of their opto-electronic properties that can be monitored by spectroscopy. We present here a mathematical method which can be applied to spectroscopic measurements when an evolving set of data is recorded: the vectorial method. The investigations and quantifications are performed by Infrared spectroscopy and XPS on organic-inorganic thin films prepared by sol-gel. The inorganic part of these hybrid thin films contains Ti oxide-network based whereas the organic part is composed of N,N-dimethylformamide and its hydrolysis products. Under UV illumination, those films exhibit intermediate bandgap behavior due to the photoreduction of Ti(IV) in Ti(III). The role of the solvent in the thin film is underlined during the process of photoreduction together with an understanding of the condensation of the Ti oxide-based network, as these evolutions are critical for the opto-electronic properties of those thin films.

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55 Calculations on quartet levels of 3-electron ions.

Fairley, N.A. and Laughlin, C., 1985.
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 9(4), pp.509-512.

Abstract

Calculations on quartet levels of 3-electron ions are reported. Some observed lines in the beam-foil spectrum of boron are discussed and photoionisation cross sections for 1s2s2p 4P0 levels of He- and Li are presented.

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56 Combined analysis methods for investigating titanium and nickel surface contamination after plasma deep etching.

Ettouri, R., Tillocher, T., Lefaucheux, P., Boutaud, B., Fernandez, V., Fairley, N., Cardinaud, C., Girard, A. and Dussart, R., 2022.
Surface and Interface Analysis, 54(2), pp.134-147.

Abstract

Plasma etching techniques can result in damage and contamination of materials, which, if not removed, can interfere with further processing. Therefore, characterisation of the etched surface is necessary to understand the basic mechanisms involved in the etching process and enable process control and cleaning procedures to be developed. A detailed investigation by means of the combined use of scanning electron microscopy coupled with energy-dispersive X-ray spectrometry (SEM/EDS), X-ray photoelectron spectroscopy (XPS) and optical microscopy (OM) has been carried out on deep titanium trenches etched by plasma. This innovative approach has provided a further insight into the microchemical structure of the surface contamination layer on both the titanium and the nickel hard mask surfaces. The described experiments were conducted on 25 to 100-μm wide trenches, first etched in bulk titanium by an optimised Cl2/SF6/O2-based inductively coupled plasma process, through an electroplated nickel hard mask. The results allow to identify chlorine, fluorine and carbon as the main contaminating agents of the nickel mask and to associate three oxidation states around the etched trenches highlighting certain specific aspects related to the passivation mechanism. These observations reinforce the scientific relevance of the combined use of complementary optical and imaging analytical techniques.

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